Dimension Edgeatomic force microscope

New member of Dimension family, closed-loop scanning, extremely cost-effective
Fast measurement, accurate results, high image resolution
Wide testing range, suitable for testing any sample
Advanced nanoscale measurements suitable for various technological levels

Dimension Edge
High cost-effectiveness, the best solution for AFM in large sample stage
Dimension ® Edge ™ Atomic force microscopy adopts the latest technology, and its instrument performance, testing functions, and operability are at the highest level among similar products. Based on top-level Dimension Icon^®Platform, The overall design of the Dimension Edge system features low drift and low noise, greatly improving data acquisition speed and reliability. With this new instrument, high-quality and publishable professional data can be obtained in just a few minutes. These improvements in detection performance have not affected the price of the instrument, which is definitely lower than your budget for such high-performance atomic force microscopes. In addition, visual feedback integration and pre configured optional features assist users in obtaining higher quality measurement results. The entire set of instruments is designed with humanization, suitable for users at all research stages and levels.

The most cost-effective closed-loop systemDimensionseriesAFM

The patented sensor design achieves both closed-loop accuracy and open-loop noise level.

Significantly reducing noise and drift, achieving imaging performance of small sample stage AFM on large sample stage AFM.

The design of the microscope and circuit ensures high imaging performance while also making the price affordable.
Fast, accurate, and high-resolution measurement results

A brand new visual operation interface with a process based design ensures quick and easy setting of parameters for each step

5-megapixel high-resolution camera and motor driven programmable platform, providing fast sample navigation and efficient multi-point measurement

The seamless transition from large-scale scanning to the highest resolution detection can obtain accurate results in a short period of time.

A solution suitable for any application on any sample
Open platform design can adapt to the needs of various experiments and samples.

The design and software of the new instrument utilize the most comprehensive Bruke AFM scanning mode and detection technology to meet the cutting-edge application requirements.

The built-in signal routing module helps researchers customize detection modes based on new research directions and experimental requirements.


Advanced nanoscale measurement capabilities suitable for various research levels

Innovative modular design achieves higher measurement performance without increasing instrument costs.

The latest Type 8 software gathers the essence of AFM professional research and development for more than 10 years. Besides the conventional scanning mode, various alternative modes are equipped according to the experimental requirements.

A complete control platform that allows for intuitive navigation and powerful programming control.
DIMENSIONseriesAFMProvided the highest qualityAFMperformance

The Dimension Edge atomic force microscope has excellent performance while retaining many technological innovations of the Dimension ICON system, achieving the best balance between mid-range price and instrument functionality. The most core technology among them is Bruker's innovative closed-loop scanning, which combines temperature compensated position sensors and modular low-noise control circuits. This needle tip scanning component reduces closed-loop noise to a single chemical bond length. To maximize this advantage, the scanner is fixed on a sturdy bridge structure with drift compensation. This bridge structure is based on FPGA temperature control and quickly stabilizes to extremely low drift rates. Therefore, Dimension Edge atomic force microscopy combines high production efficiency, high precision, sample universality of large sample stages, closed-loop operation, and high-resolution images that were previously only available on small sample stages and open-loop instruments. It can obtain real images of any sample and achieve breakthrough experimental results.

Complete AFM functionality

Dimension Edge not only includes various conventional scanning modes and Bruker patented technology, but also provides solutions for specific application areas, such as nanoscale electrical measurements and material characterization in controlled environments. These functions can achieve precise imaging and single point spectral line measurement in a wide range of applications, such as characterization of solar and semiconductor devices and imaging of multiphase polymer materials, in situ imaging of life science samples from single molecules to whole cells, and study of individual nanoparticles.

Electrical characterization
Dimension Edge not only connects an AFM probe to a low-noise current amplifier, but also develops the Dark Lift mode, which is the only method to clearly separate the photoelectric effect from the intrinsic conductivity of the sample in conducting atomic force data. It is based on Brooke's patented application of the famous Lift Mode in magnetic and electrostatic force microscopes. The system utilizes these two performances to ensure optimal testing in electrostatic potential imaging applications. So far, the scanning capacitance microscope (SCM) combined with the closed-loop (constant loss) Dark Lift mode remains the most accurate solution for characterizing doping concentration. However, if researchers want to detect small voltage changes with the highest sensitivity, they can easily combine the lift mode with surface potential microscopy. The Dimension Edge system provides an ideal solution for any electrostatic potential imaging application through a dual frequency approach.